发明名称 |
FLASH MEMORY CELL AND FABRICATION METHOD THEREOF |
摘要 |
PURPOSE: A flash memory cell and a fabrication method thereof are provided which can improve the disturbance characteristics of the cell by forming a source and a drain of the cell with one metal line, and can reduce a parasitic capacitance and can simplify its fabrication process. CONSTITUTION: A word line is connected to a gate electrode. A source and a drain are formed in a horizontal direction and a vertical direction with the above word line in turn, by bordering to the word line. A contact line(280) connects an adjacent pair of a source and a drain electrically among the sources and the drains formed in the horizontal direction. And a bit line(300) is connected to the contact line to connect the source and the drain formed in the horizontal direction electrically.
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申请公布号 |
KR20030079208(A) |
申请公布日期 |
2003.10.10 |
申请号 |
KR20020018066 |
申请日期 |
2002.04.02 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, YONG UK;KIM, GI JUN;KIM, BONG GIL;PARK, SEONG GI |
分类号 |
G11C16/06;(IPC1-7):G11C16/06 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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