发明名称 IMAGE PICKUP APPARATUS AND DEFECT INSPECTION APPARATUS FOR PHOTOMASK
摘要 The present invention has a configuration in which a line confocal optical system is formed and plural times of illumination by lines of lights are carried out. Particularly, in the present invention, the diffraction grating 32 produces the mxn number of sub beams. Further, the mxn number of sub beams are deflected by the acoustic optical element 33 so that their irradiation areas are to be continuous. Therefore, since the beam carries out scanning using the mxn number of sub beams, scanning can be completed in a short time.
申请公布号 US2003189703(A1) 申请公布日期 2003.10.09
申请号 US20020261679 申请日期 2002.10.02
申请人 LASERTEC CORPORATION 发明人 YONEZAWA MAKOTO;KUSUNOSE HARUHIKO
分类号 G01N21/88;G01N21/956;G03F1/84;H01L21/66;(IPC1-7):G01N21/00 主分类号 G01N21/88
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