MULTIPLE PLATE TIP OR SAMPLE SCANNING RECONFIGURABLE SCANNED PROBE MICROSCOPE WITH TRANSPARENT INTERFACING OF FAR-FIELD OPTICAL MICROSCOPES

摘要

The invention is directed to a scanned probe microscope including one plate (12.1) allowing for tip scanning and second plate (12.2) other allowing for sample scanning, with the optical axis of the scanned probe microscope being free to permit incorporation into standard optical microscopes.