发明名称 Substrate processing system and method
摘要 A method for transferring semiconductor wafers can suppress the generation of native oxides or watermarks, or the like, in cleaning the semiconductor wafers. In the semiconductor wafer transfer method of the preferred embodiment, first and second process chambers, and a dry unit are vertically arranged in a housing. The preferred method includes transferring the wafer between these chambers and the dry unit by a first non-contact hold type of a transfer robot, transferring the wafer between the housing and a wafer cassette by a second non-contact hold type of a transfer robot, and feeding nitrogen gas into the housing from gas-feeding inlets.
申请公布号 US2003191551(A1) 申请公布日期 2003.10.09
申请号 US20030404496 申请日期 2003.04.01
申请人 GOTOH HIDETO;WATARI TOHRU;TAKEDA KAZUYOSHI 发明人 GOTOH HIDETO;WATARI TOHRU;TAKEDA KAZUYOSHI
分类号 B65G49/00;B65G49/07;H01L21/00;H01L21/304;H01L21/677;H01L21/683;H01L21/687;(IPC1-7):G06F19/00;G06F7/00 主分类号 B65G49/00
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