发明名称 Photolithographic mask fabrication
摘要 A method of making a photolithographic mask includes forming a metal-silicon layer on a substrate, and processing at least a portion of the metal-silicon layer. The metal-silicon layer has a first thickness and the portions of the metal-silicon layer are processed to a second thickness that is less than the first thickness. The method also includes forming a reflector layer on the metal-silicon layer to produce a mask blank and then forming the mask from the mask blank. The mask blank includes the substrate, metal-silicon layer, and reflector layer.
申请公布号 US2003190532(A1) 申请公布日期 2003.10.09
申请号 US20020117603 申请日期 2002.04.04
申请人 YAN PEI-YANG 发明人 YAN PEI-YANG
分类号 G03F1/00;G03F1/14;(IPC1-7):G03F1/00 主分类号 G03F1/00
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