发明名称 Circuit for the detection of clock signal period abnormalities
摘要 <p>The invention provides for a clock monitoring circuit comprising a first flip-flop circuit for latching and outputting an input signal when a given transition of a clock signal occurs between its two logic levels, a second flip-flop circuit for latching and outputting the output signal of the first flip-flop circuit when a given transition of the clock signal occurs between its two logic levels, delay means for delaying the output signal of the second flip-flop circuit by a time interval that is shorter than a predetermined period of the clock signal and for outputting the resultant signal as an input signal to the first flip-flop circuit, and a gate circuit for receiving the output signal of the first flip-flop circuit and the output signal of the second flip-flop circuit, and for outputting a signal of a first logic level when the period of the clock signal is equal to, or greater than, the predetermined time interval and for outputting a signal of a second logic level when the period of the clock signal is shorter than the predetermined time interval. <IMAGE></p>
申请公布号 EP1237282(B1) 申请公布日期 2003.10.08
申请号 EP20020250671 申请日期 2002.01.31
申请人 NEC ELECTRONICS CORPORATION 发明人 SENBA, HISANORI
分类号 G06F1/04;G01R31/317;G06F1/14;H03K5/14;H03K5/159;H03K5/19;(IPC1-7):H03K21/40 主分类号 G06F1/04
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