发明名称 METHOD FOR FORMING CONTACT PLUG OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact plug of a semiconductor device is provided to be capable of restraining out-diffusion of boron in an insulating layer and regeneration of a native oxide layer. CONSTITUTION: After forming an insulating layer(13) on a semiconductor substrate(11) having a junction region(12), a contact hole is formed to expose the junction region(12). The contact hole is cleaned by H2-RTP(Rapid Thermal Processing) while flowing a gas containing phosphorous, wherein the gas is a diluted PH3 gas. Thereby, the out-diffusion of boron and the regeneration of a native oxide layer are restrained.
申请公布号 KR20030078548(A) 申请公布日期 2003.10.08
申请号 KR20020017664 申请日期 2002.03.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, U SEOK
分类号 H01L21/28;H01L21/311;H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L21/28
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