发明名称 POLISHING PAD, POLISHING APPARATUS, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad, a polishing apparatus provided with the polishing pad, and a method for manufacturing a semiconductor device using the polishing apparatus, which are used to form flat surfaces on glass, semiconductor, dielectric-substance/metal composite substance, integrated circuits, etc., and can polish a surface of a board so as to produce few scratches, and can optically and exactly measure polishing conditions during polishing. <P>SOLUTION: The polishing pad 4 is provided with a polishing layer 1, and one or more transparent window members 2 which are integrally formed in a part of the polishing layer to optically measure the polishing conditions. The polishing pad is characterized in that the transparent window members are made of a transparent resin composition having a phase-separated structure. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003285260(A) 申请公布日期 2003.10.07
申请号 JP20020092079 申请日期 2002.03.28
申请人 TORAY IND INC 发明人 JIYOU KUNITAKA;OTA MASAMI;HASHISAKA KAZUHIKO
分类号 B24B37/013;B24B37/20;B24B37/22;B24B37/24;H01L21/304 主分类号 B24B37/013
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