ELECTRIC NEAR-FIELD PROBE USED IN SCANNING SYSTEM

摘要

PURPOSE: An electric near-field probe used in a scanning system is provided to directly measure an electric filed component of an object using a photo-conductive sampling technique. CONSTITUTION: An electric near-field probe includes a photo-conductive switch assembly(610) and an optical waveguide(620) coupled to one side of the photo-conductive switch assembly(610). A tapered bevel edge section(630) is formed at one side of the optical waveguide(620). An inclined plane is formed at the front end of the tapered bevel edge section(630). An inclined angle of the front end of the tapered bevel edge section(630) is about 45 degrees so as to measure three dimensional perpendicular electric field component. Thus, the inclined plane of the optical waveguide(620) is oval shape when a circular optical fiber is used as the optical waveguide(620).