发明名称 FABRICATING METHOD OF SILICON CARBIDE SUBSTRATE, SCHOTTKY BARRIER DIODE AND SILICON CARBIDE FILM AND SILICON CARBIDE SUBSTRATE FABRICATED WITH THIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a fabricating method of silicon carbide substrate which provides a substrate adapted its specification of wafer to the structure of a device including the substrate, as well as the substrate fabricated with this method, and a fabricating method of a Schottky barrier diode and a silicon carbide film in a way of saving more money and resources than the present. SOLUTION: A substrate for silicon carbide SOI active layer 5 is pasted on a supporting substrate 2 to perform heating treatment and separated at the layer of ion implantation 6 which is the cutoff region of the crystal lattice to form a silicon carbide SOI substrate 1. The substrate 1 is finished after flattening the surface of separation 4a by means of annealing and polishing. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003282845(A) 申请公布日期 2003.10.03
申请号 JP20020078972 申请日期 2002.03.20
申请人 MITSUBISHI ELECTRIC CORP 发明人 MATSUNO YOSHINORI
分类号 H01L29/872;H01L21/02;H01L21/265;H01L21/762;H01L27/12;H01L29/47;(IPC1-7):H01L27/12 主分类号 H01L29/872
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