发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To reduce the leak current in MOS transistors used for a logic evaluator in a logic circuit and suppress the rise of a noise voltage to expand the operation margin. SOLUTION: A synchronous logic circuit comprises: a pMOS transistor M1 connected between a power source terminal Vdd and a first node N1 with a clock signal CLK inputted to its gate; an nMOS transistor M2 connected between a ground terminal Vss and a second node N2 with the clock signal CLK inputted to its gate; and a logic evaluator 10 composed of nMOS transistors M31, 32 connected in parallel between the nodes N1, N2 with input signals IN1, IN2 fed to the gates of both transistors. A pMOS transistor M4 is inserted between the bodies of the nMOS transistors M31, 32 with the Vss connected to its gate. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003283329(A) 申请公布日期 2003.10.03
申请号 JP20020079409 申请日期 2002.03.20
申请人 TOSHIBA CORP 发明人 FUSE TSUNEAKI;KAMEYAMA ATSUSHI
分类号 H01L21/822;H01L27/04;H03K19/0944;H03K19/096;(IPC1-7):H03K19/096;H03K19/094 主分类号 H01L21/822
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