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经营范围
发明名称
Abtastgerät für Probenmikroskop
摘要
申请公布号
DE69719458(T2)
申请公布日期
2003.10.02
申请号
DE1997619458T
申请日期
1997.11.13
申请人
SEIKO INSTRUMENTS INC., CHIBA
发明人
INOUE, AKIRA
分类号
G01B7/34;G01N27/00;(IPC1-7):G01B7/34
主分类号
G01B7/34
代理机构
代理人
主权项
地址
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