发明名称 SEMICONDUCTOR ELEMENT AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor element comprising a first semiconductor region (1), a second semiconductor region (2) having a conductivity type different from that of the first semiconductor region (1), and a third semiconductor region (3) arranged between the first semiconductor region (1) and the second semiconductor region (2) while containing impurities at a low concentration. An inner junction region (8) is formed through direct junction of the first semiconductor region (1) and the second semiconductor region (2) and an outer junction region (9) is formed through junction of the third semiconductor region (3) surrounding the inner junction region (8) and the first semiconductor region (1) or the second semiconductor region (2). Since breakdown due to impurities adhering to the outer junction region (9) is eliminated, withstand voltage of the semiconductor element increases and the breakdown voltage is stabilized.
申请公布号 WO03081681(A1) 申请公布日期 2003.10.02
申请号 WO2003JP03181 申请日期 2003.03.17
申请人 SANKEN ELECTRIC CO., LTD.;TATEYA, JUN 发明人 TATEYA, JUN
分类号 H01L21/329;H01L29/417;H01L29/861;(IPC1-7):H01L29/861;H01L29/866 主分类号 H01L21/329
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