发明名称 |
SEMICONDUCTOR ELEMENT AND METHOD FOR FABRICATING THE SAME |
摘要 |
A semiconductor element comprising a first semiconductor region (1), a second semiconductor region (2) having a conductivity type different from that of the first semiconductor region (1), and a third semiconductor region (3) arranged between the first semiconductor region (1) and the second semiconductor region (2) while containing impurities at a low concentration. An inner junction region (8) is formed through direct junction of the first semiconductor region (1) and the second semiconductor region (2) and an outer junction region (9) is formed through junction of the third semiconductor region (3) surrounding the inner junction region (8) and the first semiconductor region (1) or the second semiconductor region (2). Since breakdown due to impurities adhering to the outer junction region (9) is eliminated, withstand voltage of the semiconductor element increases and the breakdown voltage is stabilized.
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申请公布号 |
WO03081681(A1) |
申请公布日期 |
2003.10.02 |
申请号 |
WO2003JP03181 |
申请日期 |
2003.03.17 |
申请人 |
SANKEN ELECTRIC CO., LTD.;TATEYA, JUN |
发明人 |
TATEYA, JUN |
分类号 |
H01L21/329;H01L29/417;H01L29/861;(IPC1-7):H01L29/861;H01L29/866 |
主分类号 |
H01L21/329 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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