发明名称 |
Electrical probe |
摘要 |
An electrical probe for a flying leakiest of a logic analyzer probe has coaxially aligned internal elements enclosed in an insulating cover. The probe has an electrically conductive contact having contact fingers extending in one direction from a support member and a contact member extending in the opposite direction. A sleeve abuts the contact member and receive a center conductor of a conductive cable that is secured in the contact member. The insulating cover has a contact cover portion and a over-mold portion that are chemically bonded together. The contact fingers are positioned in the contact cover and the over-mold portion encapsulates the rest of the probe. The contact fingers are aligned parallel with one side of a square aperture formed in the contact cover. A resistive element may be interposed between the contact member and the sleeve.
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申请公布号 |
US2003184276(A1) |
申请公布日期 |
2003.10.02 |
申请号 |
US20020112231 |
申请日期 |
2002.03.29 |
申请人 |
ANDERSON IAN P.;RUSSELL BRIAN G. |
发明人 |
ANDERSON IAN P.;RUSSELL BRIAN G. |
分类号 |
G01R1/067;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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