发明名称 |
Method and apparatus for testing transducer heads in magnetic storage systems |
摘要 |
An apparatus and associated testing method for identifying void heads in magnetic storage systems in which a first bit error rate is determined using data written at a first overshoot amount. A second bit error rate is determined using data written at a second rate current in a second overshoot amount. A physically damaged transducer head is identified based upon a comparison of the first bit error rate to the second bit error rate.
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申请公布号 |
US2003184286(A1) |
申请公布日期 |
2003.10.02 |
申请号 |
US20020261010 |
申请日期 |
2002.09.30 |
申请人 |
CHEW VICTOR WK;HEW EDWARD YK;LOH DAVID KL;NGWE MYINT;LEONG WONG HON;TECK SAY KWEE |
发明人 |
CHEW VICTOR WK;HEW EDWARD YK;LOH DAVID KL;NGWE MYINT;LEONG WONG HON;TECK SAY KWEE |
分类号 |
G11B5/00;G11B5/012;G11B5/127;G11B5/31;G11B5/455;(IPC1-7):G01R33/12;G11B5/09 |
主分类号 |
G11B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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