发明名称 Field effect transistor and application device thereof
摘要 The present invention provides a MOSFET having a low on-state resistance and a high withstand voltage as well as a small output capacitance (C(gd), etc.). The MOSFET has a p-type base layer 4 and a n-type source layer 5 selectively formed on the surface of the p-type base layer 4. A n-type drain layer 7 is formed in a position apart from the p-type base layer 4. On the surface of the region between the p-type base layer 4 and the n-type drain layer 7, a n-type drift semiconductor layer 12 and a p-type drift semiconductor layer 13 are alternately arranged from the p-type base layer 4 to the n-type drain layer 7. Further, in the region between the n-type source layer 5 and the n-type drain layer 7, a gate electrode 15 is formed via a gate insulating film 14. With the structure, the neighboring region of the gate electrode is depleted by a built in potential between the n-type drift semiconductor layer 12 and the p-type drift semiconductor layer 13 or by the potential of the gate electrode, when the gate electrode, source electrode, and drain electrode are at 0 potential.
申请公布号 US2003183858(A1) 申请公布日期 2003.10.02
申请号 US20030401137 申请日期 2003.03.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KITAGAWA MITSUHIKO;AIZAWA YOSHIAKI
分类号 H01L29/06;H01L29/423;H01L29/78;(IPC1-7):H01L29/76;H01L31/062;H01L31/113;H01L31/12;H01L33/00 主分类号 H01L29/06
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