发明名称 |
ELECTROPOLISHING APPARATUS, ELECTROPOLISHING METHOD, AND METHOD FOR MANAUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
The formation of a groove wiring or a via contact which causes no retreat of a metal section by overpolishing by removing a section carrying little current which locally rises in a wafer face with the progress of electropolishing. In an electropolishing apparatus comprising a counter electrode (11) at a position facing a workpiece substrate (51), the counter electrode (11) consists of concentrically disposed electrodes (11a-11e). Each of the electrodes (11a-11e) has a power supply source (13) controlled independently and comprises a detector (unillustrated) for detecting a change in the current and voltage between each of the electrodes (11a-11e) and the workpiece substrate (51) and a controller (15) for controlling a power supply to the electrodes (11a-11e) on the basis of a change in the current and voltage detected by this detector.
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申请公布号 |
WO03080899(A1) |
申请公布日期 |
2003.10.02 |
申请号 |
WO2003JP03112 |
申请日期 |
2003.03.14 |
申请人 |
SONY CORPORATION;NOGAMI, TAKESHI;KOMAI, NAOKI |
发明人 |
NOGAMI, TAKESHI;KOMAI, NAOKI |
分类号 |
C25F7/00;H01L21/3063;H01L21/321;H01L21/768;(IPC1-7):C25F7/00;H01L21/306 |
主分类号 |
C25F7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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