CIRCUIT FOR GENERATING PULSE, SEMICONDUCTOR TESTING DEVICE USING THE SAME, METHOD OF TESTING SEMICONDUCTOR, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To solve such a problem that a dispersion is generated in the propagation delay time of a delay circuit by a factor of a temperature change accompanying the fluctuation of electric power consumption, so as to make the pulse generation time difficult to be controlled precisely, in a delay circuit using a CMOS-IC. SOLUTION: This pulse generation circuit of the present invention is provided with a dummy pulse generating means for generating a dummy pulse in a period in which a pulse is not generated originally, and by keeping the electric power consumption constant in the pulse generating circuit, without expanding a dummy delay circuit (electric power consumption circuit) of a large scale, the electric power consumption per unit time is controlled to be constant. COPYRIGHT: (C)2004,JPO