发明名称 Chemical vapor deposition methods, atomic layer deposition methods, and valve assemblies for use with a reactive precursor in semiconductor processing
摘要 The invention includes chemical vapor deposition methods, including atomic layer deposition, and valve assemblies for use with a reactive precursor in semiconductor processing. In one implementation, a chemical vapor deposition method includes positioning a semiconductor substrate within a chemical vapor deposition chamber. A first deposition precursor is fed to a remote plasma generation chamber positioned upstream of the deposition chamber, and a plasma is generated therefrom within the remote chamber and effective to form a first active deposition precursor species. The first species is flowed to the deposition chamber. During the flowing, flow of at least some of the first species is diverted from entering the deposition chamber while feeding and maintaining plasma generation of the first deposition precursor within the remote chamber. At some point, diverting is ceased while feeding and maintaining plasma generation of the first deposition precursor within the remote chamber. Other aspects and implementations are contemplated.
申请公布号 US2003183156(A1) 申请公布日期 2003.10.02
申请号 US20020107609 申请日期 2002.03.26
申请人 DANDO ROSS S.;SANDHU GURTEJ S.;MARDIAN ALLEN P. 发明人 DANDO ROSS S.;SANDHU GURTEJ S.;MARDIAN ALLEN P.
分类号 C23C16/44;C23C16/452;C23C16/455;C30B25/10;C30B25/14;(IPC1-7):C30B23/00 主分类号 C23C16/44
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