发明名称 METHOD FOR MANUFACTURING TFT SRAM DEVICE
摘要 PURPOSE: A method for manufacturing a TFT(Thin Film Transistor) SRAM device is provided to be capable of preventing degradation of the TFT by improving a contact plug between the third and fourth polysilicon layer. CONSTITUTION: The third polysilicon layer(15) as a gate of a TFT is formed. After forming a gate oxide layer(16) on the third polysilicon layer, the fourth polysilicon layer as a channel is formed without using a contact. A load oxide layer(18) and an interlayer dielectric(19) are sequentially formed on the resultant structure. A node contact hole is formed by sequentially patterning the fourth polysilicon layer, the gate oxide layer and the third polysilicon layer. A barrier layer(21) and a metal plug(22) are formed in the node contact hole, thereby forming a metal node contact for connecting directly the third and fourth polysilicon layer.
申请公布号 KR20030077301(A) 申请公布日期 2003.10.01
申请号 KR20020016349 申请日期 2002.03.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG, YUN SEOK
分类号 H01L21/8244;H01L27/11;(IPC1-7):H01L27/11;H01L21/824 主分类号 H01L21/8244
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