| 摘要 |
An x-ray imaging detector having an x-ray converter layer, a pixellated detection array closely adjoining the x-ray converter layer, and a substrate supporting the detection array, the substrate having a surface nearest said x-ray converter layer, the substrate including one or more elements having atomic numbers greater than 22, said elements having a total concentration in the substrate of greater than about 1 mole percent relative to the total number of moles of elements having atomic numbers of 22 or less, the substrate having a thickness in the same direction as the thickness of the x-ray converter of less than about 0.2 mm2 divided by the thickness of the converter in millimeters, the substrate having a dimensionless absorption exponent of greater than about 0.5 and less than about 5 for gamma ray emission of Am241 at about 60 keV; wherein AE(Am241 60 keV)=t*(k1e1+k2e2+k3e3+ . . . ) wherein AE(Am241 60 keV) represents the absorption exponent of the substrate relative to the about 60 keV gamma ray emission of Am241; t represents the thickness of the substrate in the principle direction of propagation of the x-ray beam; e1, e2, e3, . . . represent the concentrations of elements in the substrate; and k1, k2, k3, . . . represent the mass attenuation coefficients of the respective elements.
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