发明名称 |
Atomically testing and setting or clearing one or more bits stored in a memory location |
摘要 |
Logic and method for or atomically testing and setting one or more bits stored in a memory location, in a single operation: disables one or more interrupts (100); access a number stored in a memory location, copies the number from the memory location to a working register (102); tests a particular bit of the number copied from the memory location (104); sets (108) or clears (110) a bit flag to reflect the state of the particular bit copied from the memory location; forces the particular bit of the number copied from the memory location to a predetermined digital state (112); and copies the number from the working register to the memory location (114). The bit flag is preferably in a processor status register used to control later conditional operations.
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申请公布号 |
EP1349066(A2) |
申请公布日期 |
2003.10.01 |
申请号 |
EP20030100576 |
申请日期 |
2003.03.07 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
TESSAROLO, ALEXANDER;PRESKITT, RANDALL |
分类号 |
G06F9/30;G06F9/308;G06F9/312;G06F9/32;G06F9/46;G06F9/52;(IPC1-7):G06F9/46 |
主分类号 |
G06F9/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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