| 摘要 |
In a semiconductor integrated circuit a shield wiring (3) is provided on a boundary of a target region to be shielded of macros (2), an inner side of the boundary, an outer side of the boundary, or an inner side and an outer side of the boundary, each being as a black box (1), so as to surround the target region. This shield wiring (3) is electrically connected to a power supply terminal or a power supply wiring (4) of the macros or the like, or to a power supply wiring on another wiring layer through a contact section (5), thereby fixing a potential of the shield wiring. An accurate delay value is then obtained by estimating an influence of crosstalk between a wiring in a region where the physical wiring pattern is clear and the shield wiring and also estimating a capacitance produced between the wirings. <IMAGE> |
