| 摘要 |
PROBLEM TO BE SOLVED: To provide a component inspection method capable of eliminating the blocking of chip components to stably perform the visual examination of the chip components without damaging the chip components, and an apparatus therefor. SOLUTION: An inspection component sent linearly by a straight feeder 6 is taken in a non-vibration trough 7 and successively sucked and, held on the undersurface of a rotary disc 13 rotated around a vertical axis or an inclined axis inclined from the vertical axis by a predetermined angle to be rotated. When the inspection component stands by on the non-vibration trough 7, the surface of the inspection component is photographed by downwardly arranged cameras 9 and 10 and, at the point of time when the inspection component sucked to the rotary disc 13 to be intermittently rotated is stopped in a moment, the back surface of the inspection component can be photographed by the upwardly arranged cameras 18 and 19. COPYRIGHT: (C)2003,JPO
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