发明名称 Substrate for semiconductor device and semiconductor device fabrication using the same
摘要 A substrate for a semiconductor device is provided, which prevents a semiconductor element or IC chip mounted thereon from being broken or damaged electrostatically in a fabrication process sequence or a semiconductor device. The substrate comprises (a) a dielectric core material with an upper surface and a lower surface; the core having a mounting area on the upper surface, a semiconductor element being mounted in the mounting area; the core having a contact area, (b) inner terminals formed on the core material; the inner terminals being used for electrical connection to the semiconductor element mounted on the core material; (c) external terminals formed on the core material; the external terminals being used for electrical connection to an external circuit provided outside the substrate; and (d) inner wiring lines formed on the core material; the inner wiring lines connecting electrically and mechanically the inner terminals with the respective external terminals; part of the inner wiring lines being located in the contact area of the core in such a way as to be able to contact an external conductor provided outside the substrate.
申请公布号 US6627986(B2) 申请公布日期 2003.09.30
申请号 US20010809083 申请日期 2001.03.16
申请人 NEC ELECTRONICS CORPORATION 发明人 ISHIHARA KAORU;SAKOTA HIROMICHI
分类号 H01L23/12;H01L23/31;H01L23/48;H01L23/498;H01L23/60;(IPC1-7):H01L23/48 主分类号 H01L23/12
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