发明名称 |
Defect inspection data processing system |
摘要 |
A defect inspection data processing system includes a client computer having an image pickup section for picking up a two-dimensional image of a to-be-inspected object to be processed in a manufacturing process, and a data transfer section for transferring data indicative of the image picked by the image pickup section. A database stores image data transferred from the client computer. The system also includes a host computer having a defect extraction section for extracting defect information from the image data stored in the database, and a good/bad judgment section for judging whether or not the to-be-inspected object is good, on the basis of the defect information extracted by the defect extraction section. The client computer is separate from the host computer and connected thereto via a communication line.
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申请公布号 |
US6629051(B2) |
申请公布日期 |
2003.09.30 |
申请号 |
US20010910747 |
申请日期 |
2001.07.23 |
申请人 |
OLYMPUS OPTICAL CO., LTD. |
发明人 |
TANAKA TOSHIHIKO |
分类号 |
G01N21/94;G01N21/956;G06T7/00;(IPC1-7):G06F11/32 |
主分类号 |
G01N21/94 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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