发明名称 Defect inspection data processing system
摘要 A defect inspection data processing system includes a client computer having an image pickup section for picking up a two-dimensional image of a to-be-inspected object to be processed in a manufacturing process, and a data transfer section for transferring data indicative of the image picked by the image pickup section. A database stores image data transferred from the client computer. The system also includes a host computer having a defect extraction section for extracting defect information from the image data stored in the database, and a good/bad judgment section for judging whether or not the to-be-inspected object is good, on the basis of the defect information extracted by the defect extraction section. The client computer is separate from the host computer and connected thereto via a communication line.
申请公布号 US6629051(B2) 申请公布日期 2003.09.30
申请号 US20010910747 申请日期 2001.07.23
申请人 OLYMPUS OPTICAL CO., LTD. 发明人 TANAKA TOSHIHIKO
分类号 G01N21/94;G01N21/956;G06T7/00;(IPC1-7):G06F11/32 主分类号 G01N21/94
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