发明名称 Semiconductor integrated circuit for low-voltage high-speed operation
摘要 For low-voltage and high-speed operation of a MOSFET in an integrated circuit, a small voltage is applied to a source node, causing slight forward bias of the source junction and thereby reducing its threshold voltage. Due to the combined effects of the bias at the source node and a body effect, the reduction in threshold voltage is larger than the absolute value of the source voltage being applied. A performance improvement over simply applying a bias voltage to the body (well) results. Detection of an event can be used to apply the performance boost to a critical path in the integrated circuit only when needed. Upon detection of a logic event, which determines that a signal will propagate through the critical path shortly thereafter, the source-node bias for circuit elements in the critical path can be adjusted in time for a speed improvement. However, the source remains at another potential when no signal is passing through the critical-path, to save power when not boosting speed.
申请公布号 US6628160(B2) 申请公布日期 2003.09.30
申请号 US20010798977 申请日期 2001.03.06
申请人 WINBOND ELECTRONICS CORPORATION 发明人 LIN SHI-TRON;PENG YUNG-CHOW
分类号 H01L27/092;H01L29/786;H03K19/00;H03K19/017;(IPC1-7):H03K3/01 主分类号 H01L27/092
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