发明名称 Method of processing substrates using pressurized mist generation
摘要 A method for stripping photoresist from semiconductor wafers. In one aspect, the invention is a method for processing integrated circuits comprising: placing at least one wafer having an edge in a process tank having a lid; closing the lid; filling the process tank with a process liquid to a predetermined level below the edge of the wafer; supplying a process gas under pressure to a remaining volume of the process tank; and applying acoustical energy to the process liquid so as to form a mist of process liquid in the process tank. Preferably, the process liquid is ozonated deionized water and the process gas is ozone.
申请公布号 US6626189(B2) 申请公布日期 2003.09.30
申请号 US20020304583 申请日期 2002.11.25
申请人 AKRION, LLC 发明人 KASHKOUSH ISMAIL;NOVAK RICHARD;NEMETH DENNIS;CHEN GIM-SYANG
分类号 H01L21/027;B08B3/02;B08B7/00;H01L21/00;H01L21/304;(IPC1-7):B08B3/00;B08B3/12 主分类号 H01L21/027
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