发明名称 POSITIVE RADIATION-SENSITIVE COMPOSITION AND PATTERN FORMING METHOD WITH IT
摘要 PROBLEM TO BE SOLVED: To provide a positive radiation-sensitive composition adaptable for ultra-fine pattern formation utilizing radiation of laser rays, ultraviolet rays or X-rays by containing an acid generating agent generating acid via radiation illumination, a polymer protected with the phenol hydroxy group or carboxylic acid group of an alkali-soluble polymer, and a water generating agent generating water when reacted with acid. SOLUTION: This positive radiation-sensitive composition contains an acid generating agent generating acid via radiation illumination, a polymer protected with the phenol hydroxy group or carboxylic acid group of an alkali-soluble polymer, and a water generating agent generating water when reacted with acid. The water generating agent selectively generates water at a radiation illumination section when reacted with the acid generated by the radiation illumination and increases the diffusion of acid at the radiation illumination section. An alcohol compound efficiently generating water via a dehydration reaction in a molecule or between molecules by an acid catalyst can be used for the water generating agent. Secondary alcohol or tertiary alcohol is preferably used within the alcohol compound because of its high reactivity with acid.
申请公布号 JPH11249290(A) 申请公布日期 1999.09.17
申请号 JP19980051796 申请日期 1998.03.04
申请人 HITACHI LTD;HITACHI CHEM CO LTD 发明人 UCHINO MASAICHI;UTAKA SONOKO
分类号 H01L21/027;G03F7/004;G03F7/039;(IPC1-7):G03F7/004 主分类号 H01L21/027
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