发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To reduce oxidation (corrosion) caused by solder leakage (5a) in a semiconductor device having a wireless structure. <P>SOLUTION: The semiconductor device has a source pad (1) provided on the approximately central surface of a semiconductor substrate (9) and a clip tip portion (4a) fixed on the center portion of the pad (1). In the device, a solder leakage stopper (2) made of a silicon nitride film (11) is formed so as to surround the periphery of the pad (1). The stopper (2) controls the expansion of the leakage (5a). Also, an opening portion (3) is formed on at least one side of the rectangular stopper (2). The length of the portion (3) is 10% or low of the one side. Low-resistant gold electrodes (8) are formed on the inside or outside of the pad (1). <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003273356(A) 申请公布日期 2003.09.26
申请号 JP20020076433 申请日期 2002.03.19
申请人 SANYO ELECTRIC CO LTD 发明人 AKIBA TAKASHI;HOSAKA KENICHI;SAITO MASAYA
分类号 H01L21/60;H01L21/336;H01L29/78 主分类号 H01L21/60
代理机构 代理人
主权项
地址