发明名称 |
SEMICONDUCTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device using an STI which provides satisfactory transistor characteristics. SOLUTION: The semiconductor device comprises: a silicon substrate 1 forming semiconductor elements; element isolating trenches 6 formed in the silicon substrate 1 for isolating active regions in the substrate 1, each having a trapezoidal profile with a width gradually reduced away from the surface; a first liner insulation layer 7 composed of a silicon oxide film or a silicon nitride oxide film of 1-5 nm formed on the trench surface; a second liner insulation layer 8 composed of a silicon nitride film of 2-8 nm formed on the trench surface; and element isolating regions 9 filling up recesses defined by the second liner insulation layer. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003273206(A) |
申请公布日期 |
2003.09.26 |
申请号 |
JP20020074871 |
申请日期 |
2002.03.18 |
申请人 |
FUJITSU LTD |
发明人 |
OTA HIROYUKI;IRIYAMA YASUNORI |
分类号 |
H01L21/76;H01L21/762;H01L21/8234;H01L27/08;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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