SYSTEME SEMICONDUCTEUR DE TEST REALISE DANS UN CHEMIN DE DECOUPE D'UNE PLAQUETTE SEMICONDUCTRICE,申请号FR19980002713-传众专利搜索

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发明名称	SYSTEME SEMICONDUCTEUR DE TEST REALISE DANS UN CHEMIN DE DECOUPE D'UNE PLAQUETTE SEMICONDUCTRICE
摘要
申请公布号	FR2775832(B1)	申请公布日期	2000.05.05
申请号	FR19980002713	申请日期	1998.03.05
申请人	STMICROELECTRONICS SA	发明人	SCHOELLKOPF JEAN PIERRE
分类号	H01L23/544;(IPC1-7):H01L27/10	主分类号	H01L23/544
代理机构		代理人
主权项
地址

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