发明名称 PRODUCTION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <p>An LSI production line including the processes of forming Cu wiring in the opening of an insulation film by means of a chemical-mechanical polishing method, and then covering the surface of the Cu wiring with a cap insulation film, wherein time required from the Cu wiring formation up to the cap insulation film deposition is set to be within four days. In addition, a semiconductor substrate that has required at least four days from a post-cleaning step up to the cap insulation film deposition process is subjected to a regenerative treatment, thereby minimizing a deterioration in a TDDB life and ensuring the reliability and production yield of an LSI.</p>
申请公布号 WO2003079429(P1) 申请公布日期 2003.09.25
申请号 JP2003001233 申请日期 2003.02.06
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