发明名称 SYSTEM FOR MEASUREMENT OF ABERRATIONS AND TOPOMETRY
摘要 A unitary system for measuring both eye aberrations and corneal topography. The system includes a sensor for receiving wavefront data, a first optical path (11), and a second optical path (12). The first optical path includes means for introducing a collimated incident beam of radiation into the eye (91) and for directing a wavefront exiting from the eye to the sensor as retinal wavefront data. Means are also provided for determining from the retinal wavefront data aberrations in the optical system. The second optical path includes means for introducing the incident beam onto the corneal surface (90) and for directing a reflected beam therefrom to the sensor as corneal wavefront data. Means are additionally provided for determining from the corneal wavefront data a topography of a corneal surface. Finally, the system comprises means for switching the incident beam between the first and the second optical path.
申请公布号 WO03077740(A1) 申请公布日期 2003.09.25
申请号 WO2003US04777 申请日期 2003.02.18
申请人 ALCON, INC.;CURATU, EUGENE 发明人 CURATU, EUGENE
分类号 A61B3/10;A61B3/103;A61B3/107;(IPC1-7):A61B3/10 主分类号 A61B3/10
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