发明名称 |
MEASURING METHOD AND DEVICE OF RELATIVE REFRACTIVE INDEX |
摘要 |
PROBLEM TO BE SOLVED: To measure a relative refractive index without measuring the actual thickness of a measuring object. SOLUTION: An optical distance between the first control point and the second control point in which a measuring object supported in a medium is sandwiched between the points, and an optical thickness of the measuring object on a line connected the control points are measured when the measuring object has the first geometrical thickness on the line, and measured when the measuring object has the second geometrical thickness. Using these 2 results, a relative refractive index of the measuring object in the medium can be obtained. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003270140(A) |
申请公布日期 |
2003.09.25 |
申请号 |
JP20020068859 |
申请日期 |
2002.03.13 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KATO MAKOTO;SUGINOUCHI TAKEHIKO;HASHIMOTO MASAHIKO |
分类号 |
G01B11/06;G01N21/41;(IPC1-7):G01N21/41 |
主分类号 |
G01B11/06 |
代理机构 |
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地址 |
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