发明名称 INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To quickly and precisely inspect various kinds of components, in an inspection device of a type in which an irradiation means irradiates an inspection subject with a laser beam. SOLUTION: Glass plates 5, 6 varying a scanning locus of the laser beam are provided between the irradiation means 3 and the components 12, 12a-12e, a relative angle in the glass plates 5, 6 is made variable for every size and every kind in each of the components 12, 12a-12e, based on inspection information 19 preliminarily input, to be rotated thereafter, and scanning suitable for the size and a shape of the each of the components 12, 12a-12e mounted on a substrate 11 is realized to attain the purpose of the present invention. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003269930(A) 申请公布日期 2003.09.25
申请号 JP20020068114 申请日期 2002.03.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ICHIKAWA IWAO;MASAKI SHIGEO
分类号 G01B11/24;G01N21/956;H05K13/08 主分类号 G01B11/24
代理机构 代理人
主权项
地址