发明名称 POSITION MEASURING SYSTEM WITH MULTIPLE BAR MIRRORS
摘要 A position measuring system is utilized for measuring a position of a stage positioned on a pedestal. As the stage is moved along a predetermined direction, a controlling device utilizes a first measuring apparatus to measure a moving direction of the stage during the first period. Then, the controlling device uses the moving direction measured by the first measuring apparatus to adjust the moving direction measured by the second measuring apparatus during the overlapping period of the first period and a second period. After adjusting the second measuring apparatus, the controlling device utilizes the second measuring apparatus to measure the moving direction of the stage during the second period.
申请公布号 US2003179358(A1) 申请公布日期 2003.09.25
申请号 US20030249105 申请日期 2003.03.17
申请人 CHEN HWEI-CHI;TING CHIN-LUNG 发明人 CHEN HWEI-CHI;TING CHIN-LUNG
分类号 G01B9/02;G03F7/20;(IPC1-7):G03B27/42 主分类号 G01B9/02
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