| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device and a testing method by which a function test for a semiconductor device can be performed at high speed and with high precision. SOLUTION: Between an output terminal of the semiconductor device 1 to be a measuring object and the beginning end side of a transmission line 3, a load resistor R1 having a high impedance is inserted. Between the termination side of the transmission line 3 and a signal detector circuit 5 an impedance matching end-of-line resistor R2 is connected, and a high-speed driver 7 for applying a variable termination voltage to the end-of-line resistor R2 is connected. A termination voltage V2 having the same phase as an expectation value signal is applied from the high-speed driver 7 to the end-of-line resistor R2, adjusting the voltage with the outputting timing of the expectation value signal outputted from the semiconductor device 1. COPYRIGHT: (C)2003,JPO
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