发明名称 Methods and systems for determining a characteristic of polishing within a zone on a specimen from combined output signals of an eddy current device
摘要 Systems and methods for characterizing polishing of a specimen are provided. One method includes scanning a specimen with an eddy current device during polishing to generate output signals at measurement spots across the specimen. The method also includes combining a portion of the output signals generated at the measurement spots located within a zone on the specimen. In addition, the method includes determining a characteristic of polishing within the zone from the combined portion of the output signals. In some instances, a zone may include a predetermined range of radial and azimuthal positions on the specimen. In one embodiment, the method may include determining a characteristic of polishing within more than one zone on the specimen. Some embodiments may include determining an additional characteristic of polishing from the characteristic of polishing within more than one zone on the specimen.
申请公布号 US2003181138(A1) 申请公布日期 2003.09.25
申请号 US20030358069 申请日期 2003.02.04
申请人 LEHMAN KURT;CHEN CHARLES;ALLEN RONALD L.;SHINAGAWA ROBERT;SETHURAMAN ANANTHA;BEVIS CHRISTOPHER F.;TRIKAS THANASSIS;CHEN HAIGUANG;MENG CHING LING 发明人 LEHMAN KURT;CHEN CHARLES;ALLEN RONALD L.;SHINAGAWA ROBERT;SETHURAMAN ANANTHA;BEVIS CHRISTOPHER F.;TRIKAS THANASSIS;CHEN HAIGUANG;MENG CHING LING
分类号 B24B37/04;B24B41/04;B24B49/04;B24B49/10;B24B49/12;(IPC1-7):B24B49/00 主分类号 B24B37/04
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