发明名称 CHEMICAL LIQUID APPLICATION APPARATUS AND CHEMICAL LIQUID CONTROL METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical liquid application apparatus capable of applying a chemical liquid such as resist to a substrate such as a wafer in the state that chemical liquid quality is maintained under optimum conditions, and a chemical liquid control method. <P>SOLUTION: The chemical liquid application apparatus comprises a coater cup 10 in which a wafer 14 is to be housed, a wafer chuck 16 and a spin motor 18 for holding the wafer in an approximately horizontal plane and rotating the wafer in the approximately horizontal plane, a coating nozzle 22 for dropwise titrating the resist on the surface of the wafer 14, a resist supply part 12 for storing and supplying the resist to the coating nozzle 22 through a pipe 40, and a control part 54 for discharging the resist stagnating in the pipe 40 for a prescribed stagnation time out of the coating nozzle 22 based on the characteristics of the resist. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003266006(A) 申请公布日期 2003.09.24
申请号 JP20020070577 申请日期 2002.03.14
申请人 FUJITSU LTD 发明人 NAGAI KOICHI;KANEMITSU HIDEYUKI
分类号 G03F7/16;B05C5/00;B05C11/08;B05C11/10;H01L21/027 主分类号 G03F7/16
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