| 摘要 |
PROBLEM TO BE SOLVED: To provide an LSI tester, an LSI testing method and an LSI device allowing a stable function test on a high-speed, asynchronous device. SOLUTION: A clock generation circuit 15 obtains a clock signal CLK whose output timing is controlled within an LSI under test 11. Using the clock signal CLK, synchronization is performed for at least sequential storing of the output of the LSI under test 11 on storage circuits (13, 14) and a judgment of comparison between an arbitrary column of an output pattern OPTN and an expected value pattern EPTN. A judgment part 19 is implemented by CPU processing. If the derived output pattern of the arbitrary column is included in the expected value pattern, it is judged as PASS. If not included, it is judged as FAIL. This makes it easy to deal with a high-speed, asynchronous device under test. COPYRIGHT: (C)2003,JPO
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