发明名称 Semiconductor thin film and semiconductor device
摘要 After an amorphous semiconductor thin film is crystallized by utilizing a catalyst element, the catalyst element is removed by performing a heat treatment in an atmosphere containing a halogen element. A resulting crystalline semiconductor thin film has features that it exhibits {111} orientation and that almost all crystal lattices have continuity at a crystal boundary. This type of grain boundaries greatly contribute to improving the carrier mobility, and make it possible to realize, semiconductor devices having very high performance.
申请公布号 US6624051(B1) 申请公布日期 2003.09.23
申请号 US20000645329 申请日期 2000.08.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OHTANI HISASHI;YAMAZAKI SHUNPEI;KOYAMA JUN;OGATA YASUSHI;MIYANAGA AKIHARU
分类号 H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/49;H01L29/786;(IPC1-7):H01L21/36 主分类号 H01L21/20
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