发明名称 Illumination device for a DUV microscope and DUV microscope
摘要 An illumination device for a DUV microscope has an illumination beam path, proceeding from a DUV light source in which are arranged a condenser and a reflection filter system which generates a DUV wavelength band and comprises four reflection filters. At these, the illumination beam is reflected in each case at the same reflection angle alpha, the illumination beam path extending coaxially in front of and behind the reflection filter system. According to the present invention, the reflection angle alpha=30° and the DUV wavelength band lambdDUV+Deltalambd has a half-value width of max. 20 nm and a peak with a maximum value S of more than 90% of the incoming light intensity. The resulting very narrow half-value width of the DUV wavelength band makes it possible for the DUV objectives of the DUV microscope to be very well-corrected.
申请公布号 US6624930(B1) 申请公布日期 2003.09.23
申请号 US20000589088 申请日期 2000.06.08
申请人 LEICA MICROSYSTEMS WETZLAR GMBH 发明人 DANNER LAMBERT;EISENKRAEMER FRANK;VEITH MICHAEL;VOLLRATH WOLFGANG;OSTERFELD MARTIN
分类号 G02B5/26;G02B5/28;G02B21/06;G02B21/16;(IPC1-7):F21V9/04;F21V9/06;G02B5/08;G02B5/20 主分类号 G02B5/26
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