SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE

摘要

PURPOSE: A sample holder of a transmission electron microscope is provided to compensate an inclination phenomenon of an image according to the magnifying power by using a rotation part including a differential gear. CONSTITUTION: A sample holder of a transmission electron microscope includes a main body portion(200), a fixing portion(215), a rotation portion(235), and a rotation plate(240). A sample(205) is adhered and fixed on the main body portion(200). The fixing portion(215) is formed on one end portion of the main body portion(200). The rotation portion(235) is adhered on the main body portion(200). The rotation plate(240) is connected to the rotation portion(235). A knob(245) is formed at a predetermined position of the rotation plate(240) which penetrates the fixing portion(215). The rotation portion(235) includes a large differential gear(225) adhered to the main body portion(200) and a small differential gear(230) connected to the rotation plate(240).