发明名称 METHOD FOR FORMING SELECTIVE FERROELECTRIC THIN FILM
摘要 PURPOSE: A method for forming a selective ferroelectric thin film is provided to be capable of simplifying the manufacturing process and reducing fabrication cost and time. CONSTITUTION: An electrode(12) is formed on a silicon substrate(11). The electrode is made of platinum. A convexoconcave region(13) is formed on the predetermined portion of the electrode. A paraelectric and ferroelectric thin film(14b,14a) are simultaneously formed on the predetermined portions of the resultant structure by depositing dielectric material. The ferroelectric thin film is formed on the convexoconcave region. Preferably, the paraelectric and ferroelectric thin film forming process is carried out using an organic metal CVD(Chemical Vapor Deposition) method.
申请公布号 KR100400205(B1) 申请公布日期 2003.09.19
申请号 KR19960020609 申请日期 1996.06.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, DAE SIK
分类号 H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/00
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