发明名称 |
METHOD FOR ETCHING THIN FILM AND METHOD FOR MANUFACTURING TRANSISTOR AND CAPACITOR OF SEMICONDUCTOR DEVICE USING THE SAME |
摘要 |
PURPOSE: A method for etching a thin film and a method for manufacturing a transistor and a capacitor of a semiconductor device using the same are provided to be capable of simplifying manufacturing processes and preventing the damage of a lower layer and the generation of residues by simultaneously patterning a metal thin film and a ferroelectric thin film using a helicon plasma etching process. CONSTITUTION: After forming a lower structure at the upper portion of a semiconductor substrate(201), an SBT(SrxBi1-xTa2O9) thin film(202), a metal thin film(203), and a metal mask(204) are sequentially formed on the resultant structure. Then, the metal thin film and the SBT thin film are simultaneously patterned by carrying out a helicon plasma etching process using the metal mask as an etching mask.
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申请公布号 |
KR20030073224(A) |
申请公布日期 |
2003.09.19 |
申请号 |
KR20020012670 |
申请日期 |
2002.03.09 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
LEE, WON JAE;RYU, SANG UK;YOO, BYEONG GON;YOO, IN GYU |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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主权项 |
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地址 |
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