发明名称 METHOD FOR ETCHING THIN FILM AND METHOD FOR MANUFACTURING TRANSISTOR AND CAPACITOR OF SEMICONDUCTOR DEVICE USING THE SAME
摘要 PURPOSE: A method for etching a thin film and a method for manufacturing a transistor and a capacitor of a semiconductor device using the same are provided to be capable of simplifying manufacturing processes and preventing the damage of a lower layer and the generation of residues by simultaneously patterning a metal thin film and a ferroelectric thin film using a helicon plasma etching process. CONSTITUTION: After forming a lower structure at the upper portion of a semiconductor substrate(201), an SBT(SrxBi1-xTa2O9) thin film(202), a metal thin film(203), and a metal mask(204) are sequentially formed on the resultant structure. Then, the metal thin film and the SBT thin film are simultaneously patterned by carrying out a helicon plasma etching process using the metal mask as an etching mask.
申请公布号 KR20030073224(A) 申请公布日期 2003.09.19
申请号 KR20020012670 申请日期 2002.03.09
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 LEE, WON JAE;RYU, SANG UK;YOO, BYEONG GON;YOO, IN GYU
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
代理机构 代理人
主权项
地址