发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH CAPACITORS
摘要 PURPOSE: A method for fabricating a semiconductor device with capacitors is provided to remarkably reduce metal contact resistance by forming a metal contact hole exposing an upper electrode using a high dielectric layer and by using a process for reducing the exposed upper electrode. CONSTITUTION: A lower electrode(87), a dielectric layer(89) and the upper electrode are sequentially stacked on a semiconductor substrate(81) to form a capacitor. An upper interlayer dielectric is formed on the entire surface of the semiconductor substrate having the capacitor. The upper interlayer dielectric is patterned to form a metal contact hole exposing a predetermined region of the upper electrode. The upper electrode exposed by the metal contact hole is reduced to decrease the quantity of oxygen inside the upper electrode.
申请公布号 KR20030073934(A) 申请公布日期 2003.09.19
申请号 KR20020013720 申请日期 2002.03.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, HAN ME;JUNG, JEONG HUI;KIM, YEONG SEON;LEE, YUN JEONG
分类号 H01L21/8242;H01L21/02;H01L21/768;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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