发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH CAPACITORS |
摘要 |
PURPOSE: A method for fabricating a semiconductor device with capacitors is provided to remarkably reduce metal contact resistance by forming a metal contact hole exposing an upper electrode using a high dielectric layer and by using a process for reducing the exposed upper electrode. CONSTITUTION: A lower electrode(87), a dielectric layer(89) and the upper electrode are sequentially stacked on a semiconductor substrate(81) to form a capacitor. An upper interlayer dielectric is formed on the entire surface of the semiconductor substrate having the capacitor. The upper interlayer dielectric is patterned to form a metal contact hole exposing a predetermined region of the upper electrode. The upper electrode exposed by the metal contact hole is reduced to decrease the quantity of oxygen inside the upper electrode.
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申请公布号 |
KR20030073934(A) |
申请公布日期 |
2003.09.19 |
申请号 |
KR20020013720 |
申请日期 |
2002.03.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, HAN ME;JUNG, JEONG HUI;KIM, YEONG SEON;LEE, YUN JEONG |
分类号 |
H01L21/8242;H01L21/02;H01L21/768;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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