MOUNT FOR FABRICATING SAMPLE FOR WAFER TEST

摘要

PURPOSE: A mount for fabricating a sample for a wafer test is provided to easily fabricate the sample and eliminate a problem arising from a grinding process in forming the sample by performing a grinding process while the grounding quality is previously set. CONSTITUTION: A frame(20) under which a lengthwise path is formed is prepared. A screw part is formed in the upper portion of a moving stage(40), coupled to the path of the frame and capable of sliding. The moving stage is transferred by a screw(30) that is positioned to rotate on the path of the frame and is coupled to the screw part over the moving stage.