发明名称 PATTERN FORMING METHOD, DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To make the distance between patterns more precise, even if processes for applying, exposing, developing, and removing photoresists are omitted, when the patterns are formed on the surface of a substance to be treated using a mask, without worsening shape precision. SOLUTION: In this pattern forming method, the whole surface of a substrate 1 is lightly etched after films 4 are formed on the surface of the substrate 1 by depositing pattern materials there via the mask 3, bulged-out portions 6 of the patterns which have entered below the mask 3 are removed. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003264151(A) 申请公布日期 2003.09.19
申请号 JP20020063016 申请日期 2002.03.08
申请人 SEIKO EPSON CORP 发明人 MORI YOSHIAKI
分类号 H01L21/3213;H01L21/205;(IPC1-7):H01L21/205;H01L21/321 主分类号 H01L21/3213
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