发明名称 STEREOSCOPIC THREE-DIMENSIONAL METROLOGY SYSTEM AND METHOD
摘要 A stereoscopic three-dimensional optical metrology system (100) and method accurately measure the location of physical features (129) on a test article (120) in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article (120) from two or more perspectives through a substantially transparent fiducial plate (190) bearing a fiducial marking (199); camera (111,112) viewing angles and apparent relative distances between a feature on a test article (120) and one or more fiducials (199) may enable accurate calculation of feature position.
申请公布号 WO03058158(A3) 申请公布日期 2003.09.18
申请号 WO2002US40610 申请日期 2002.12.18
申请人 APPLIED PRECISION, LLC;SNOW, DONALD, B.;STROM, JOHN, T.;KRAFT, RAYMOND, H. 发明人 SNOW, DONALD, B.;STROM, JOHN, T.;KRAFT, RAYMOND, H.
分类号 G01B11/00;G01B11/03;G01B11/245;G01B11/25;G01C11/06;H01L21/66;H05K13/00 主分类号 G01B11/00
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